Yao Wang 0002, Sorin Cotofana, Liang Fang. A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits. In Proceedings of the 2011 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2011, San Diego, CA, USA, June 8-9, 2011. pages 175-180, IEEE Computer Society, 2011. [doi]
@inproceedings{0002CF11,
title = {A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits},
author = {Yao Wang 0002 and Sorin Cotofana and Liang Fang},
year = {2011},
url = {http://dl.acm.org/citation.cfm?id=2052123},
researchr = {https://researchr.org/publication/0002CF11},
cites = {0},
citedby = {0},
pages = {175-180},
booktitle = {Proceedings of the 2011 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2011, San Diego, CA, USA, June 8-9, 2011},
publisher = {IEEE Computer Society},
isbn = {978-1-4577-0993-7},
}