Yao Wang 0002, Sorin Cotofana, Liang Fang. A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits. In Proceedings of the 2011 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2011, San Diego, CA, USA, June 8-9, 2011. pages 175-180, IEEE Computer Society, 2011. [doi]
Abstract is missing.