Meta Pattern Concern Score: A Novel Evaluation Measure with Human Values for Multi-classifiers - researchr publication authors

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Yanyun Wang 0003, Dehui Du, Yuanhao Liu. Meta Pattern Concern Score: A Novel Evaluation Measure with Human Values for Multi-classifiers. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 597-604, IEEE, 2023. [doi]

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