Yanyun Wang 0003, Dehui Du, Yuanhao Liu. Meta Pattern Concern Score: A Novel Evaluation Measure with Human Values for Multi-classifiers. In IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023. pages 597-604, IEEE, 2023. [doi]
@inproceedings{0003DL23,
title = {Meta Pattern Concern Score: A Novel Evaluation Measure with Human Values for Multi-classifiers},
author = {Yanyun Wang 0003 and Dehui Du and Yuanhao Liu},
year = {2023},
doi = {10.1109/SMC53992.2023.10394380},
url = {https://doi.org/10.1109/SMC53992.2023.10394380},
researchr = {https://researchr.org/publication/0003DL23},
cites = {0},
citedby = {0},
pages = {597-604},
booktitle = {IEEE International Conference on Systems, Man, and Cybernetics, SMC 2023, Honolulu, Oahu, HI, USA, October 1-4, 2023},
publisher = {IEEE},
isbn = {979-8-3503-3702-0},
}