Junjie Chen 0003, Jiaqi Han, Peiyi Sun, Lingming Zhang, Dan Hao, Lu Zhang. Compiler bug isolation via effective witness test program generation. In Marlon Dumas, Dietmar Pfahl, Sven Apel, Alessandra Russo, editors, Proceedings of the ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/SIGSOFT FSE 2019, Tallinn, Estonia, August 26-30, 2019. pages 223-234, ACM, 2019. [doi]
@inproceedings{0003HSZHZ19,
title = {Compiler bug isolation via effective witness test program generation},
author = {Junjie Chen 0003 and Jiaqi Han and Peiyi Sun and Lingming Zhang and Dan Hao and Lu Zhang},
year = {2019},
doi = {10.1145/3338906.3338957},
url = {https://doi.org/10.1145/3338906.3338957},
researchr = {https://researchr.org/publication/0003HSZHZ19},
cites = {0},
citedby = {0},
pages = {223-234},
booktitle = {Proceedings of the ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/SIGSOFT FSE 2019, Tallinn, Estonia, August 26-30, 2019},
editor = {Marlon Dumas and Dietmar Pfahl and Sven Apel and Alessandra Russo},
publisher = {ACM},
isbn = {978-1-4503-5572-8},
}