Compiler bug isolation via effective witness test program generation

Junjie Chen 0003, Jiaqi Han, Peiyi Sun, Lingming Zhang, Dan Hao, Lu Zhang. Compiler bug isolation via effective witness test program generation. In Marlon Dumas, Dietmar Pfahl, Sven Apel, Alessandra Russo, editors, Proceedings of the ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/SIGSOFT FSE 2019, Tallinn, Estonia, August 26-30, 2019. pages 223-234, ACM, 2019. [doi]

Abstract

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