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Temperature Reliability of Junctionless Twin Gate Recessed Channel (JL-TGRC) MOSFET with Different Gate Material for Low Power Digital-Logic Applications

Ajay Kumar 0004, Samarth Singh, Balark Tiwari, Rishu Chaujar. Temperature Reliability of Junctionless Twin Gate Recessed Channel (JL-TGRC) MOSFET with Different Gate Material for Low Power Digital-Logic Applications. In TENCON 2018 - 2018 IEEE Region 10 Conference, Jeju, South Korea, October 28-31, 2018. pages 1070-1074, IEEE, 2018. [doi]

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Ajay Kumar 0004

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Samarth Singh

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Balark Tiwari

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Rishu Chaujar

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