Ajay Kumar 0004, Samarth Singh, Balark Tiwari, Rishu Chaujar. Temperature Reliability of Junctionless Twin Gate Recessed Channel (JL-TGRC) MOSFET with Different Gate Material for Low Power Digital-Logic Applications. In TENCON 2018 - 2018 IEEE Region 10 Conference, Jeju, South Korea, October 28-31, 2018. pages 1070-1074, IEEE, 2018. [doi]
@inproceedings{0004STC18,
title = {Temperature Reliability of Junctionless Twin Gate Recessed Channel (JL-TGRC) MOSFET with Different Gate Material for Low Power Digital-Logic Applications},
author = {Ajay Kumar 0004 and Samarth Singh and Balark Tiwari and Rishu Chaujar},
year = {2018},
doi = {10.1109/TENCON.2018.8650267},
url = {https://doi.org/10.1109/TENCON.2018.8650267},
researchr = {https://researchr.org/publication/0004STC18},
cites = {0},
citedby = {0},
pages = {1070-1074},
booktitle = {TENCON 2018 - 2018 IEEE Region 10 Conference, Jeju, South Korea, October 28-31, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5457-6},
}