Kai Ni 0006, Aniket Gupta, Om Prakash, Simon Thomann, Xiaobo Sharon Hu, Hussam Amrouch. Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]
@inproceedings{0006GPTHA20, title = {Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET}, author = {Kai Ni 0006 and Aniket Gupta and Om Prakash and Simon Thomann and Xiaobo Sharon Hu and Hussam Amrouch}, year = {2020}, doi = {10.1109/IRPS45951.2020.9128323}, url = {https://doi.org/10.1109/IRPS45951.2020.9128323}, researchr = {https://researchr.org/publication/0006GPTHA20}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020}, publisher = {IEEE}, isbn = {978-1-7281-3199-3}, }