Zhuo Zhang 0007, Yan Lei, Meng Yan, Yue Yu 0001, Jiachi Chen, Shangwen Wang, Xiaoguang Mao. Reentrancy Vulnerability Detection and Localization: A Deep Learning Based Two-phase Approach. In 37th IEEE/ACM International Conference on Automated Software Engineering, ASE 2022, Rochester, MI, USA, October 10-14, 2022. ACM, 2022. [doi]
Abstract is missing.