Om Prakash 0007, Rodion Novkin, Virinchi Roy Surabhi, Prashanth Krishnamurthy, Ramesh Karri, Farshad Khorrami, Hussam Amrouch. Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning. In IEEE International Symposium on Circuits and Systems, ISCAS 2023, Monterey, CA, USA, May 21-25, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.