A Probabilistic Fault Detection Approach: Application to Bearing Fault Detection

Bin Zhang 0008, Chris Sconyers, Carl S. Byington, Romano Patrick, Marcos E. Orchard, George J. Vachtsevanos. A Probabilistic Fault Detection Approach: Application to Bearing Fault Detection. IEEE Transactions on Industrial Electronics, 58(5):2011-2018, 2011. [doi]

Authors

Bin Zhang 0008

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Chris Sconyers

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Carl S. Byington

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Romano Patrick

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Marcos E. Orchard

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George J. Vachtsevanos

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