Bin Zhang 0008, Chris Sconyers, Carl S. Byington, Romano Patrick, Marcos E. Orchard, George J. Vachtsevanos. A Probabilistic Fault Detection Approach: Application to Bearing Fault Detection. IEEE Transactions on Industrial Electronics, 58(5):2011-2018, 2011. [doi]
@article{0008SBPOV11,
title = {A Probabilistic Fault Detection Approach: Application to Bearing Fault Detection},
author = {Bin Zhang 0008 and Chris Sconyers and Carl S. Byington and Romano Patrick and Marcos E. Orchard and George J. Vachtsevanos},
year = {2011},
doi = {10.1109/TIE.2010.2058072},
url = {http://dx.doi.org/10.1109/TIE.2010.2058072},
researchr = {https://researchr.org/publication/0008SBPOV11},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {58},
number = {5},
pages = {2011-2018},
}