Defect detection on EL images based on deep feature optimized by metric learning for imbalanced data

Kun Liu 0009, Jiangrui Han, Haiyong Chen, Haowei Yan, Peng Yang. Defect detection on EL images based on deep feature optimized by metric learning for imbalanced data. In Hui Yu 0001, editor, 25th International Conference on Automation and Computing, ICAC 2019, Lancaster, United Kingdom, September 5-7, 2019. pages 1-5, IEEE, 2019. [doi]

Abstract

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