Chang Liu 0040, Han Yu 0001, Boyang Li 0001, Zhiqi Shen 0001, Zhanning Gao, Peiran Ren, Xuansong Xie, LiZhen Cui, Chunyan Miao. Noise-Resistant Deep Metric Learning With Ranking-Based Instance Selection. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2021, virtual, June 19-25, 2021. pages 6811-6820, Computer Vision Foundation / IEEE, 2021. [doi]
Abstract is missing.