Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Sandeep Kumar Goel, Krishnendu Chakrabarty, editors, Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. CRC Press, 2014. [doi]

Editors

Sandeep Kumar Goel

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Krishnendu Chakrabarty

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