Abstract is missing.
- Fundamentals of Small-Delay Defect TestingSudhakar M. Reddy, Peter Maxwell. 1-22
- K Longest PathsDuncan M. Hank Walker. 23-48
- Timing-Aware ATPGMark Kassab, Benoit Nadeau-Dostie, Xijiang Lin. 49-72
- Faster-than-at-Speed Test for Screening Small-Delay DefectsNisar Ahmed, Mohammad Tehranipoor. 73-94
- Circuit Path Grading Considering Layout, Process Variations, and Cross TalkKe Peng, Mahmut Yilmaz, Mohammad Tehranipoor. 95-118
- Output Deviations-Based SDD TestingMahmut Yilmaz. 119-146
- Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay DefectsSandeep Kumar Goel, Narendra Devta-Prasanna. 147-160
- Circuit Topology-Based Test Pattern Generation for Small-Delay DefectsSandeep Kumar Goel, Krishnendu Chakrabarty. 161-184
- Small-Delay Defect Coverage MetricsNarendra Devta-Prasanna, Sandeep Kumar Goel. 185-210