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Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects

Sandeep Kumar Goel, Narendra Devta-Prasanna. Hybrid/Top-off Test Pattern Generation Schemes for Small-Delay Defects. In Sandeep Kumar Goel, Krishnendu Chakrabarty, editors, Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. pages 147-160, CRC Press, 2014.

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