Akilez Krishnamurthy A., Madhu N. Belur, Debraj Chakraborty. Comparison of various linear discriminant analysis techniques for fault diagnosis of Re-usable Launch Vehicle. In Proceedings of the 50th IEEE Conference on Decision and Control and European Control Conference, CDC-ECC 2011, Orlando, FL, USA, December 12-15, 2011. pages 3050-3055, IEEE, 2011. [doi]
Abstract is missing.