Nicolás de Abajo, Alberto B. Diez, Vanesa Lobato, Sergio R. Cuesta. ANN quality diagnostic models for packaging manufacturing: an industrial data mining case study. In Won Kim, Ron Kohavi, Johannes Gehrke, William DuMouchel, editors, Proceedings of the Tenth ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, Seattle, Washington, USA, August 22-25, 2004. pages 799-804, ACM, 2004. [doi]
Abstract is missing.