Noise Effects on Performance of Low Power Design Schemes in Deep Submicron Regime - researchr publication authors

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Mohamed Abbas, Makoto Ikeda, Kunihiro Asada. Noise Effects on Performance of Low Power Design Schemes in Deep Submicron Regime. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 87-95, IEEE Computer Society, 2004. [doi]

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