Zia Abbas, Mauro Olivieri. Impact of technology scaling on leakage power in nano-scale bulk CMOS digital standard cells. Microelectronics Journal, 45(2):179-195, 2014. [doi]
@article{AbbasO14,
title = {Impact of technology scaling on leakage power in nano-scale bulk CMOS digital standard cells},
author = {Zia Abbas and Mauro Olivieri},
year = {2014},
doi = {10.1016/j.mejo.2013.10.013},
url = {http://dx.doi.org/10.1016/j.mejo.2013.10.013},
researchr = {https://researchr.org/publication/AbbasO14},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {45},
number = {2},
pages = {179-195},
}