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Measure of high frequency input impedance to study the instability of power devices in short circuit

Carmine Abbate, Giovanni Busatto, Annunziata Sanseverino, D. Tedesco, Francesco Velardi. Measure of high frequency input impedance to study the instability of power devices in short circuit. Microelectronics Reliability, 88:540-544, 2018. [doi]

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Carmine Abbate

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Giovanni Busatto

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Annunziata Sanseverino

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D. Tedesco

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Francesco Velardi

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