Carmine Abbate, Giovanni Busatto, Annunziata Sanseverino, D. Tedesco, Francesco Velardi. Measure of high frequency input impedance to study the instability of power devices in short circuit. Microelectronics Reliability, 88:540-544, 2018. [doi]
@article{AbbateBSTV18,
title = {Measure of high frequency input impedance to study the instability of power devices in short circuit},
author = {Carmine Abbate and Giovanni Busatto and Annunziata Sanseverino and D. Tedesco and Francesco Velardi},
year = {2018},
doi = {10.1016/j.microrel.2018.07.035},
url = {https://doi.org/10.1016/j.microrel.2018.07.035},
researchr = {https://researchr.org/publication/AbbateBSTV18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {540-544},
}