O. Abdelmalek, David Hély, Vincent Beroulle. EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement. In Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March, 2013, Abu Dhabi, UAE. pages 20-24, IEEE, 2013. [doi]
@inproceedings{AbdelmalekHB13, title = {EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement}, author = {O. Abdelmalek and David Hély and Vincent Beroulle}, year = {2013}, doi = {10.1109/DTIS.2013.6527771}, url = {http://dx.doi.org/10.1109/DTIS.2013.6527771}, researchr = {https://researchr.org/publication/AbdelmalekHB13}, cites = {0}, citedby = {0}, pages = {20-24}, booktitle = {Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March, 2013, Abu Dhabi, UAE}, publisher = {IEEE}, isbn = {978-1-4673-6038-8}, }