O. Abdelmalek, David Hély, Vincent Beroulle. EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement. In Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2013, 26-28 March, 2013, Abu Dhabi, UAE. pages 20-24, IEEE, 2013. [doi]
Abstract is missing.