A Feature-Based Solution to Forward Problem in Electrical Capacitance Tomography of Conductive Materials

Mohamed A. Abdelrahman, Ankush Gupta, Wael A. Deabes. A Feature-Based Solution to Forward Problem in Electrical Capacitance Tomography of Conductive Materials. IEEE T. Instrumentation and Measurement, 60(2):430-441, 2011. [doi]

Abstract

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