Salem Abdennadher, Saghir A. Shaikh. Practices in Mixed-Signal and RF IC Testing. IEEE Design & Test of Computers, 24(4):332-339, 2007. [doi]
@article{AbdennadherS07:0,
title = {Practices in Mixed-Signal and RF IC Testing},
author = {Salem Abdennadher and Saghir A. Shaikh},
year = {2007},
doi = {10.1109/MDT.2007.143},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.143},
tags = {testing},
researchr = {https://researchr.org/publication/AbdennadherS07%3A0},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {24},
number = {4},
pages = {332-339},
}