Abdessatar Abderrahman, Mohamad Sawan, Yvon Savaria, Abdelhakim Khouas. New Analog Test Metrics Based on Probabilistic and Deterministic Combination Approaches. In 14th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2007, Marrakech, Morocco, December 11-14, 2007. pages 82-85, IEEE, 2007. [doi]
@inproceedings{AbderrahmanSSK07,
title = {New Analog Test Metrics Based on Probabilistic and Deterministic Combination Approaches},
author = {Abdessatar Abderrahman and Mohamad Sawan and Yvon Savaria and Abdelhakim Khouas},
year = {2007},
doi = {10.1109/ICECS.2007.4510936},
url = {http://dx.doi.org/10.1109/ICECS.2007.4510936},
researchr = {https://researchr.org/publication/AbderrahmanSSK07},
cites = {0},
citedby = {0},
pages = {82-85},
booktitle = {14th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2007, Marrakech, Morocco, December 11-14, 2007},
publisher = {IEEE},
isbn = {978-1-4244-1377-5},
}