Tatsuya Abe, Shinpei Hayashi, Motoshi Saeki. Modeling Security Threat Patterns to Derive Negative Scenarios. In 20th Asia-Pacific Software Engineering Conference, APSEC 2013, Ratchathewi, Bangkok, Thailand, December 2-5, 2013 - Volume 1. pages 58-66, IEEE, 2013. [doi]
Abstract is missing.