Fumitaka Abe, Yutaro Kobayashi, Kenji Sawada, Keisuke Kato, Osamu Kobayashi, Haruo Kobayashi. Low-distortion signal generation for ADC testing. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-10, IEEE, 2014. [doi]
@inproceedings{AbeKSKKK14, title = {Low-distortion signal generation for ADC testing}, author = {Fumitaka Abe and Yutaro Kobayashi and Kenji Sawada and Keisuke Kato and Osamu Kobayashi and Haruo Kobayashi}, year = {2014}, doi = {10.1109/TEST.2014.7035304}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035304}, researchr = {https://researchr.org/publication/AbeKSKKK14}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014}, publisher = {IEEE}, isbn = {978-1-4799-4722-5}, }