Fumitaka Abe, Yutaro Kobayashi, Kenji Sawada, Keisuke Kato, Osamu Kobayashi, Haruo Kobayashi. Low-distortion signal generation for ADC testing. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-10, IEEE, 2014. [doi]
Abstract is missing.