Raphael Abele, Jean-Luc Damoiseaux, Daniele Fronte, Pierre-Yvan Liardet, Jean-Marc Boï, Djamal Merad. Efficient Integrated Circuits Characterization Through Computer Vision Assistance. In 25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020. pages 1247-1250, IEEE, 2020. [doi]
Abstract is missing.