Line-scan detection system to identify rare earth elements in rocks

T. Abend, S. K. Sharma, M. Fuchs, J. Beyer, Johannes Heitmann, Richard Gloaguen. Line-scan detection system to identify rare earth elements in rocks. In 2019 IEEE SENSORS, Montreal, QC, Canada, October 27-30, 2019. pages 1-3, IEEE, 2019. [doi]

Authors

T. Abend

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S. K. Sharma

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M. Fuchs

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J. Beyer

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Johannes Heitmann

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Richard Gloaguen

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