T. Abend, S. K. Sharma, M. Fuchs, J. Beyer, Johannes Heitmann, Richard Gloaguen. Line-scan detection system to identify rare earth elements in rocks. In 2019 IEEE SENSORS, Montreal, QC, Canada, October 27-30, 2019. pages 1-3, IEEE, 2019. [doi]
@inproceedings{AbendSFBHG19,
title = {Line-scan detection system to identify rare earth elements in rocks},
author = {T. Abend and S. K. Sharma and M. Fuchs and J. Beyer and Johannes Heitmann and Richard Gloaguen},
year = {2019},
doi = {10.1109/SENSORS43011.2019.8956697},
url = {https://doi.org/10.1109/SENSORS43011.2019.8956697},
researchr = {https://researchr.org/publication/AbendSFBHG19},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {2019 IEEE SENSORS, Montreal, QC, Canada, October 27-30, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1634-1},
}