Defects detection on TFT lines of flat panels using a feed forward neural network

H. A. Abeysundara, Hiroshi Hamori, Takeshi Matsui, Masatoshi Sakawa. Defects detection on TFT lines of flat panels using a feed forward neural network. Artif. Intell. Research, 2(4):1-12, 2013. [doi]

Abstract

Abstract is missing.