Miron Abramovici, Prashant S. Parikh. Warning: 100 Fault Coverage May Be Misleading!!. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 662-668, IEEE Computer Society, 1992.
@inproceedings{AbramoviciP92,
title = {Warning: 100 Fault Coverage May Be Misleading!!},
author = {Miron Abramovici and Prashant S. Parikh},
year = {1992},
tags = {coverage},
researchr = {https://researchr.org/publication/AbramoviciP92},
cites = {0},
citedby = {0},
pages = {662-668},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}