Rui Abreu, Peter Zoeteweij, Arjan J. C. van Gemund. An observation-based model for fault localization. In Ben Liblit, Atanas Rountev, editors, Proceedings of the 2008 International Workshop on Dynamic Analysis: held in conjunction with the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA 2008), WODA 2008, Seattle, Washington, USA, July 21, 2008. pages 64-70, ACM, 2008. [doi]
Abstract is missing.