Erkan Acar, Sule Ozev. Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 374-379, IEEE Computer Society, 2005. [doi]
@inproceedings{AcarO05:0,
title = {Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements},
author = {Erkan Acar and Sule Ozev},
year = {2005},
doi = {10.1109/VTS.2005.42},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.42},
researchr = {https://researchr.org/publication/AcarO05%3A0},
cites = {0},
citedby = {0},
pages = {374-379},
booktitle = {23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2314-5},
}