Assessment of True Worst Case Circuit Performance Under Interconnect Parameter Variations - researchr publication authors

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Emrah Acar, Lawrence T. Pileggi, Sani R. Nassif, Ying Liu. Assessment of True Worst Case Circuit Performance Under Interconnect Parameter Variations. In 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 26-28 March 2001, San Jose, CA, USA. pages 431-436, IEEE Computer Society, 2001. [doi]

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