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Jayadev Acharya, Hirakendu Das, Alon Orlitsky, Shengjun Pan, Narayana P. Santhanam. Classification using pattern probability estimators. In IEEE International Symposium on Information Theory, ISIT 2010, June 13-18, 2010, Austin, Texas, USA, Proceedings. pages 1493-1497, IEEE, 2010. [doi]

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