Classification using pattern probability estimators

Jayadev Acharya, Hirakendu Das, Alon Orlitsky, Shengjun Pan, Narayana P. Santhanam. Classification using pattern probability estimators. In IEEE International Symposium on Information Theory, ISIT 2010, June 13-18, 2010, Austin, Texas, USA, Proceedings. pages 1493-1497, IEEE, 2010. [doi]

@inproceedings{AcharyaDOPS10,
  title = {Classification using pattern probability estimators},
  author = {Jayadev Acharya and Hirakendu Das and Alon Orlitsky and Shengjun Pan and Narayana P. Santhanam},
  year = {2010},
  doi = {10.1109/ISIT.2010.5513570},
  url = {http://doi.ieeecomputersociety.org/10.1109/ISIT.2010.5513570},
  researchr = {https://researchr.org/publication/AcharyaDOPS10},
  cites = {0},
  citedby = {0},
  pages = {1493-1497},
  booktitle = {IEEE International Symposium on Information Theory, ISIT 2010, June 13-18, 2010, Austin, Texas, USA, Proceedings},
  publisher = {IEEE},
}