Dhruva Acharyya, Jim Plusquellic. Hardware Results Demonstrating Defect Detection Using Power Supply Signal Measurements. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 433-438, IEEE Computer Society, 2005. [doi]
@inproceedings{AcharyyaP05,
title = {Hardware Results Demonstrating Defect Detection Using Power Supply Signal Measurements},
author = {Dhruva Acharyya and Jim Plusquellic},
year = {2005},
doi = {10.1109/VTS.2005.47},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.47},
researchr = {https://researchr.org/publication/AcharyyaP05},
cites = {0},
citedby = {0},
pages = {433-438},
booktitle = {23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2314-5},
}