Roger Achkar, Johnny Narcis, Wael Abou Awad, Karim Hitti. Smart X-Ray Scanners Using Artificial Neural Networks. In 20th UKSim-AMSS International Conference on Computer Modelling and Simulation, UKSim 2018, Cambridge, United Kingdom, March 27-29, 2018. pages 6-8, IEEE, 2018. [doi]
Abstract is missing.