Jan Ackaert, Klara Bessemans, Eddy De Backer. Charging induced damage by photoconduction through thick inter metal dielectrics. Microelectronics Reliability, 43(9-11):1525-1529, 2003. [doi]
@article{AckaertBB03,
title = {Charging induced damage by photoconduction through thick inter metal dielectrics},
author = {Jan Ackaert and Klara Bessemans and Eddy De Backer},
year = {2003},
doi = {10.1016/S0026-2714(03)00270-1},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00270-1},
researchr = {https://researchr.org/publication/AckaertBB03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {9-11},
pages = {1525-1529},
}