John M. Acken. Testing for bridging faults (shorts) in CMOS circuits. In Charles E. Radke, editor, Proceedings of the 20th Design Automation Conference, DAC '83, Miami Beach, Florida, USA, June 27-29, 1983. pages 717-718, ACM/IEEE, 1983. [doi]
@inproceedings{Acken83,
title = {Testing for bridging faults (shorts) in CMOS circuits},
author = {John M. Acken},
year = {1983},
url = {http://dl.acm.org/citation.cfm?id=800749},
researchr = {https://researchr.org/publication/Acken83},
cites = {0},
citedby = {0},
pages = {717-718},
booktitle = {Proceedings of the 20th Design Automation Conference, DAC '83, Miami Beach, Florida, USA, June 27-29, 1983},
editor = {Charles E. Radke},
publisher = {ACM/IEEE},
isbn = {0-8186-0026-8},
}