John M. Acken. The Final Barriers to Widespread Use of I::DDQ:: Testing. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 300, IEEE Computer Society, 1995.
@inproceedings{Acken95, title = {The Final Barriers to Widespread Use of I::DDQ:: Testing}, author = {John M. Acken}, year = {1995}, tags = {testing}, researchr = {https://researchr.org/publication/Acken95}, cites = {0}, citedby = {0}, pages = {300}, booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995}, publisher = {IEEE Computer Society}, isbn = {0-7803-2992-9}, }