Bertha Mayela Toledo Acosta, Patrick Bouthemy, Charles Kervrann. A common image representation and a patch-based search for correlative light-electron-microscopy (CLEM) registration. In 13th IEEE International Symposium on Biomedical Imaging, ISBI 2016, Prague, Czech Republic, April 13-16, 2016. pages 257-260, IEEE, 2016. [doi]
Abstract is missing.