External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric

Eliana Acurio, Lionel Trojman, Brice De Jaeger, Benoit Bakeroot, Stefaan Decoutere. ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-6, IEEE, 2021. [doi]

Authors

Eliana Acurio

This author has not been identified. Look up 'Eliana Acurio' in Google

Lionel Trojman

This author has not been identified. Look up 'Lionel Trojman' in Google

Brice De Jaeger

This author has not been identified. Look up 'Brice De Jaeger' in Google

Benoit Bakeroot

This author has not been identified. Look up 'Benoit Bakeroot' in Google

Stefaan Decoutere

This author has not been identified. Look up 'Stefaan Decoutere' in Google
runs on