Differential Reflection Characteristics for Optical Probing of Nanoscale Anisotropic Layered System

Peep Adamson. Differential Reflection Characteristics for Optical Probing of Nanoscale Anisotropic Layered System. In 2005 International Conference on MEMS, NANO, and Smart Systems (ICMENS 2005), 24-27 July 2005, Banff, Alberta, Canada. pages 307-313, IEEE Computer Society, 2005. [doi]

Abstract

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